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251–254. CiteSeerX 10.1.1.136.3757. doi:10.1109/IEDM.2002.1175825. ISBN 0-7803-7462-2. S2CID 7106946. Archived from the original (PDF) on 2020-05-27. Retrieved...22 KB (2,361 words) - 03:19, 19 June 2024
251–254. CiteSeerX 10.1.1.136.3757. doi:10.1109/IEDM.2002.1175825. ISBN 0-7803-7462-2. S2CID 7106946. Xuejue Huang; Wen-Chin Lee; Kuo, C.; Hisamoto, D.; Leland...14 KB (1,384 words) - 16:54, 5 June 2024- Electron Devices Meeting. pp. 267–270. doi:10.1109/IEDM.2002.1175829. ISBN 0-7803-7462-2. S2CID 10151651. "NEC test-produces world's smallest transistor". Thefreelibrary...34 KB (2,836 words) - 01:22, 6 July 2024
- Electron Devices Meeting. pp. 267–270. doi:10.1109/IEDM.2002.1175829. ISBN 0-7803-7462-2. S2CID 10151651. Schwierz, Frank; Wong, Hei; Liou, Juin J. (2010). Nanometer...75 KB (5,940 words) - 12:59, 25 May 2024
- Electron Devices Meeting. pp. 251–254. doi:10.1109/IEDM.2002.1175825. ISBN 0-7803-7462-2. S2CID 7106946. Archived from the original (PDF) on May 27, 2020. Retrieved...31 KB (2,719 words) - 15:24, 5 July 2024
- Electron Devices Meeting. p. 711. doi:10.1109/IEDM.2002.1175937. ISBN 0-7803-7462-2. Franklin, Aaron D.; Luisier, Mathieu; Han, Shu-Jen; Tulevski, George;...36 KB (4,615 words) - 02:32, 6 April 2024
- Electron Devices Meeting. pp. 267–270. doi:10.1109/IEDM.2002.1175829. ISBN 0-7803-7462-2. S2CID 10151651. "NEC test-produces world's smallest transistor". The...51 KB (4,744 words) - 02:58, 9 May 2024